Characterization of quaternary metal oxide films by synchrotron X-ray fluorescence microprobe

Journal Article · Mon Dec 01 04:00:00 EST 1997 · Applied Spectroscopy

DOI:https://doi.org/10.1366/0003702971939749· OSTI ID:615363

Perry, D L; Thompson, A C; Russo, R E; Mao, X L; Chapman, K L ^[1]

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1. Lawrence Berkeley National Laboratory, University of California, Berkeley, California94720 (United States)

A synchrotron X-ray fluorescence microprobe has been used to study the composition and microstructure of pulsed-laser ablation-deposited films of calcium-nickel-potassium oxides that have applications in heterogeneous catalysis. The films, whose individual metal oxide components have widely varying boiling points and thus prevent a solid-phase synthesis with the use of standard thermal techniques, represent a new quaternary metal oxide phase containing the three elements. Experimental conditions for preparing the films are given. The X-ray fluorescence microprobe data are discussed with respect to both the distribution of the three metals in the films at the micrometer lateral spatial resolution level and the presence of trace amounts of metals that were introduced into the films as contaminants in targets made of the parent three-metal oxide. {copyright} {ital 1997} {ital Society for Applied Spectroscopy}

• Research Organization: Lawrence Berkeley National Laboratory
• DOE Contract Number: AC03-76SF00098
• OSTI ID: 615363
• Journal Information: Applied Spectroscopy, Journal Name: Applied Spectroscopy Journal Issue: 12 Vol. 51; ISSN 0003-7028; ISSN APSPA4
• Country of Publication: United States
• Language: English

Related Subjects

40 CHEMISTRY
CONCENTRATION RATIO
DEPOSITION
FILMS
METALS
OXIDES
TRACE AMOUNTS
X-RAY FLUORESCENCE ANALYSIS