Electron-impact ionization of Ar/sub 2/, ArKr, Kr/sub 2/, KrXe, and Xe/sub 2/
Journal Article
·
· Phys. Rev., A; (United States)
Relative cross sections for electron-impact ionization of the rare-gas Van der Waals dimers Ar/sub 2/, ArKr, Kr/sub 2/, KrXe, and Xe/sub 2/ have been measured with a mass spectrometer in the electron energy range from threshold to 180 eV. The following appearance potentials for direct ionization from the corresponding neutral dimers have been found: Ar/sub 2//sup ts+/: 15.2 +- 0.2 eV, ArKr/sup +/: 14.0 +- 0.2 eV, Kr/sub 2//sup ts+/: 13.45 +- 0.3 eV, KrXe/sup +/: 12.2 +- 0.2 eV, and Xe/sub 2//sup ts+/: 11.75 +- 0.3 eV. These values agree with those obtained in recent photoelectron studies. The appearance potential of Ar/sub 2//sup ts+/ formation via associative ionization of argon atoms is found to be 14.6 +- 0.2 eV.
- Research Organization:
- Institut fuer Theoretische Physik, Universitaet Innsbruck, Austria
- OSTI ID:
- 6151609
- Journal Information:
- Phys. Rev., A; (United States), Journal Name: Phys. Rev., A; (United States) Vol. 19:6; ISSN PLRAA
- Country of Publication:
- United States
- Language:
- English
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