Low-temperature structural phase transition in La/sub 2/CuO/sub 4/

Journal Article · Thu Oct 01 04:00:00 EDT 1987 · Phys. Rev. B: Condens. Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.36.5713· OSTI ID:6141155

Skelton, E F; Elam, W T; Gubser, D U; Letourneau, V; Osofsky, M S; Qadri, S B; Toth, L E; Wolf, S A

Simultaneous electrical resistance and x-ray diffraction measurements have been made on samples of La/sub 2/CuO/sub 4/. The resistance data show a local maximum near 36 K; the x-ray data reveal a low-temperature structural transition which is correlated with the electrical anomaly. In addition to the new diffraction pattern, remnants of the orthorhombically distorted K/sub 2/NiF/sub 4/ structure of the parent phase are seen in varying amounts in all samples at low temperatures. These observations are in agreement with recent theoretical predictions.

• Research Organization: Condensed Matter and Radiation Sciences Division, Naval Research Laboratory, Washington, D.C. 20375-5000
• OSTI ID: 6141155
• Journal Information: Phys. Rev. B: Condens. Matter; (United States), Journal Name: Phys. Rev. B: Condens. Matter; (United States) Vol. 36:10; ISSN PRBMD
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360202* -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
CHALCOGENIDES
COHERENT SCATTERING
COPPER COMPOUNDS
COPPER OXIDES
CRYSTAL-PHASE TRANSFORMATIONS
DIFFRACTION
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
LANTHANUM COMPOUNDS
LANTHANUM OXIDES
LOW TEMPERATURE
OXIDES
OXYGEN COMPOUNDS
PHASE TRANSFORMATIONS
PHYSICAL PROPERTIES
RARE EARTH COMPOUNDS
SCATTERING
TRANSITION ELEMENT COMPOUNDS
X-RAY DIFFRACTION