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Study of the extreme ultraviolet spectrum of O/sub 2/ by electron impact

Journal Article · · J. Chem. Phys.; (United States)
OSTI ID:6131297

We have measured in the laboratory the electron impact emission cross sections for O/sub 2/ at 200 eV. Included in the study are all emission features in the extreme ultraviolet from 40 to 131 nm at a resolution of 0.5 nm. The features are entirely from the dissociation products (OI, OII, OIII). Additionally we have measured the excitation functions from 0 to 400 eV for characteristic OI multiplets at 98.9 and 102.6 nm and for OII multiplets at 53.9 and 83.3 nm. We find the OI multiplets are formed near the dissociation limit whereas the OII multiplets have a threshold about 10 eV above the dissociation limit. We also determine the total VUV emission cross section of O/sub 2/ from 40 to 200 nm and indicate the effects of autoionization to the measured emission spectrum.

Research Organization:
Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California 91109
OSTI ID:
6131297
Journal Information:
J. Chem. Phys.; (United States), Journal Name: J. Chem. Phys.; (United States) Vol. 82:6; ISSN JCPSA
Country of Publication:
United States
Language:
English