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Surface impedance measurements of YBa sub 2 Cu sub 3 O sub 7 minus X thin films in stripline resonators

Conference · · IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:6109526
;  [1]
  1. Massachusetts Inst. of Tech., Lexington, MA (United States). Lincoln Lab.
This paper reports on measurements of the microwave surface impedance of thin films of YBa{sub 2}Cu{sub 3}O{sub 7{minus}x} as a function of temperature, frequency and rf magnetic field, H{sub rf}, using a stripline-resonator technique. The films were deposited in situ by single-target off-axis magnetron sputtering. The frequency range was from 0.4 to 20 GHz, the temperature range from 4.2 K to T{sub c}, and the rf magnetic field range from 0 to 30 Oe. The surface resistance R{sub S} at 4.2 K and 1.5 GHz is 4 {times} 10{sub {minus}6}{Omega}. The penetration depth is determined to be 0.167 {mu}m in the best film. In some films R{sub S} shows weak dependence on H{sub rf} before rising rapidly. These behaviors differ from those observed in bulk ceramic YBa{sub 2}Cu{sub 3}O{sub 7{minus}x} and in unpatterned films measured in microwave cavities. However, the shape of R{sub S}(H{sub rf}) for the YBa{sub 2}Cu{sub 3}O{sub 7{minus}x} films is similar to that of Nb and NbN films measured in the same stripline geometry. The authors discuss the effects of the current distributions in the resonator on the measured R{sub S}(H{sub rf}). The authors will also present measurements of the intermodulation products in the resonators and discuss the implications of the R{sub S} and intermodulation measurements for microwave device applications.
OSTI ID:
6109526
Report Number(s):
CONF-900944--
Conference Information:
Journal Name: IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States) Journal Volume: 27:2
Country of Publication:
United States
Language:
English