X-Ray Diffraction Measurement of the Effect of Layer Thickness on the Ferroelectric Transition in Epitaxial KTaO{sub 3}/KNbO{sub 3} Multilayers

Journal Article · Fri May 01 04:00:00 EDT 1998 · Physical Review Letters

DOI:https://doi.org/10.1103/PhysRevLett.80.4317· OSTI ID:610738

Specht, E D; Christen, H; Norton, D P; Boatner, L A ^[1]

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1. Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6118 (United States)

KTaO{sub 3}/ KNbO{sub 3} strained-layer superlattices of variable periodicity were grown by pulsed laser deposition on KTaO{sub 3} substrates. The KNbO{sub 3} layers were found to be strained in plane to match the substrate lattice parameter. Therefore, the applied strain is independent of the layer thickness. High-temperature x-ray diffraction was used to measure the ferroelectric-paraelectric phase transition temperature T{sub c} . For superlattice periodicity {Lambda}{le}5.1 nm , T{sub c}=475 K , independent of {Lambda} . For {Lambda}{gt}5.1 nm , T{sub c} increases to 825K at {Lambda}=33.8 nm . {copyright} {ital 1998} {ital The American Physical Society}

• Research Organization: Oak Ridge National Laboratory
• DOE Contract Number: AC05-96OR22464
• OSTI ID: 610738
• Journal Information: Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 19 Vol. 80; ISSN 0031-9007; ISSN PRLTAO
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
DEPOSITION
DIELECTRIC MATERIALS
EPITAXY
LASER RADIATION
NIOBATES
PHASE TRANSFORMATIONS
POTASSIUM COMPOUNDS
STRAINS
SUPERLATTICES
TANTALATES
THICKNESS
X-RAY DIFFRACTION