Radiation-induced frequency transients in AT, BT, and SC cut quartz resonators
Earlier studies of transient frequency changes in high-purity swept AT quartz resonators led to the conclusion that impurity-induced effects were small, while the observed changes were qualitatively and quantitatively well characterized in terms of the time changing temperature of the vibrating quartz and its effect on frequency. 5 MHz, AT cut fifth overtone, and BT and SC cut third overtone resonators were prepared from a single stone of Sawyer swept Premium-Q quartz. The resonators were operated in precision ovenized oscillators at or near their turnover temperatures. Pulsed irradiation, at dose levels of the order of 10/sup 4/ rads (Si) per pulse, was accomplished at Sandia. The experimental data display negative frequency transients for the AT cut resonators, positive frequency transients for the BT cut resonators, and very small transient effects for the SC cut resonators. From these experimental results, it is concluded that no measurable impurity-induced frequency changes are observed in this high-purity swept-quartz and that the frequency transients are accurately modelled in terms of transient temperature effects stemming from the thermal characteristics of the resonator structure.
- Research Organization:
- Sandia Labs., Albuquerque, NM (USA)
- DOE Contract Number:
- EY-76-C-04-0789
- OSTI ID:
- 6102518
- Report Number(s):
- SAND-79-0169C; CONF-790554-1; TRN: 79-018528
- Resource Relation:
- Conference: 33. annual symposium on frequency control, Atlantic City, NJ, USA, 30 May 1979
- Country of Publication:
- United States
- Language:
- English
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Radiation induced transient thermal effects in 5 MHz AT quartz resonators
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47 OTHER INSTRUMENTATION
OSCILLATORS
RESONATORS
QUARTZ
PHYSICAL RADIATION EFFECTS
IMPURITIES
TRANSIENTS
CHALCOGENIDES
ELECTRONIC EQUIPMENT
OXIDES
OXYGEN COMPOUNDS
RADIATION EFFECTS
SILICON COMPOUNDS
SILICON OXIDES
360605* - Materials- Radiation Effects
440300 - Miscellaneous Instruments- (-1989)