Second order gradiometer and dc SQUID integrated on a planar substrate

Journal Article · Thu Feb 14 23:00:00 EST 1985 · Appl. Phys. Lett.; (United States)

DOI:https://doi.org/10.1063/1.95605· OSTI ID:6101872

van Nieuwenhuyzen, G J; de Waal, V J

An integrated system of a thin-film niobium dc superconducting quantum interference device (SQUID) and a second order gradiometer on a planar substrate is described. The system consists of a dc SQUID with eight loops in parallel, each sensitive to the second derivative partial/sup 2/B/sub z//partialx/sup 2/ of the magnetic field. The calculated SQUID inductance is 1.3 nH. With an overall size of 16 x 16.5 mm/sup 2/ a sensitivity of 1.5 x 10/sup -9/ Tm/sup -2/ Hz/sup -1//sup ///sup 2/ is obtained. The measured transfer function for uniform fields perpendicular to the plane of the gradiometer is 2.1 x 10/sup -7/ T Phi/sup -1//sub 0/.

• Research Organization: Department of Applied Physics, Delft University of Technology, Delft, the Netherlands
• OSTI ID: 6101872
• Journal Information: Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 46:4; ISSN APPLA
• Country of Publication: United States
• Language: English

Related Subjects

420201* -- Engineering-- Cryogenic Equipment & Devices
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
DESIGN
ELECTRONIC EQUIPMENT
ELEMENTS
EQUIPMENT
FABRICATION
FILMS
FLUXMETERS
MEASURING INSTRUMENTS
METALS
MICROWAVE EQUIPMENT
NIOBIUM
PERFORMANCE
SIGNAL-TO-NOISE RATIO
SQUID DEVICES
SUPERCONDUCTING DEVICES
THIN FILMS
TRANSITION ELEMENTS