Correlation between interatomic distances and the x-ray-absorption near-edge structure of single-crystal sapphire

Journal Article · Fri Oct 01 00:00:00 EDT 1993 · Physical Review, B: Condensed Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.48.10047· OSTI ID:6097175

Chen, J M ^[1]; Simons, J K ^[2]; Tan, K H ^[3]; Rosenberg, R A ^[4]

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1. Synchrotron Radiation Research Center, Hsinchu, 30077, Taiwan (Taiwan, Province of China)
2. Department of Chemistry, University of Wisconsin, Madison, Wisconsin 53706 (United States)
3. Canadian Synchrotron Radiation Facility, 3731 Schneider Drive, Stoughton, Wisconsin 53589 (United States)
4. Argonne National Laboratory, Argonne, Illinois 60439 (United States)

The high-resolution Al [ital L]-edge x-ray-absorption near-edge structure from single-crystal sapphire has been recorded by measuring the total-electron yield and x-ray-fluorescence yield with synchrotron radiation. The edge structures up to 11 eV from the absorption edge are assigned in terms of the transitions of Al 2[ital p] electrons to empty levels using molecular-orbital calculations. The post-edge features between 11 and 60 eV above the Al [ital L][sub 23] absorption edge were found to correlate very well with the interatomic distances from the absorbing atom to its neighboring atoms as predicted by the multiple-scattering model.

• OSTI ID: 6097175
• Journal Information: Physical Review, B: Condensed Matter; (United States), Vol. 48:14; ISSN 0163-1829
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
SAPPHIRE
ELECTRONIC STRUCTURE
ABSORPTION SPECTRA
CORRELATIONS
FLUORESCENCE
INTERATOMIC DISTANCES
MOLECULAR ORBITAL METHOD
MONOCRYSTALS
MULTIPLE SCATTERING
X RADIATION
CALCULATION METHODS
CORUNDUM
CRYSTALS
DISTANCE
ELECTROMAGNETIC RADIATION
IONIZING RADIATIONS
LUMINESCENCE
MINERALS
OXIDE MINERALS
RADIATIONS
SCATTERING
SPECTRA
360204* - Ceramics
Cermets
& Refractories- Physical Properties