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An extreme ultraviolet spectroscopic diagnostic for fluctuations of electron density and temperature in tokamak plasmas

Journal Article · · Journal of Applied Physics; (USA)
DOI:https://doi.org/10.1063/1.347010· OSTI ID:6096226
; ; ;  [1]
  1. Department of Physics and Astronomy, The Johns Hopkins University, Baltimore, Maryland 21218 (USA)
Extreme ultraviolet (XUV) spectral line emissivities, originating from resonant transitions with upper states excited mainly from ground or both ground and lowest metastable states by electron collisional excitations of highly ionized intrinsic impurities in tokamak plasmas, are linear functions of both electron density and temperature fluctuations, {ital {tilde n}}{sub {ital e}} and {ital {tilde T}}{sub {ital e}}, when the fluctuations are small and at high frequency. Correlations between measured intensities of spectral lines can thus provide localized measurements of the fluctuations. Newly developed XUV monochromators of high throughput enable accurate and fast diagnostics of {ital {tilde n}}{sub {ital e}} and {ital {tilde T}}{sub {ital e}} for the study of the tokamak plasma microturbulence.
OSTI ID:
6096226
Journal Information:
Journal of Applied Physics; (USA), Journal Name: Journal of Applied Physics; (USA) Vol. 68:11; ISSN 0021-8979; ISSN JAPIA
Country of Publication:
United States
Language:
English