Concurrent and nonconcurrent error detection in analog-to-digital converters

Thesis/Dissertation · Fri Jan 01 04:00:00 EST 1988

OSTI ID:6093090

Simpson, M L

Advances in VLSI technology have made possible the incorporation of very complex mixed devices, or those containing both digital and analog components, on a single integrated chip. Of the more complex mixed devices being implemented on a single substrate is the analog-to-digital converter. Future technology promises even more chip are available for these mixed device. A viable usage for the expanding area on these integrated chips is in the field of error detection with application in fault-tolerant systems. Analog-to-digital converters are unique from the standpoint that they are frequently the interface between critical sensors and the control unit. It is imperative in these situations to be able to detect errors in the conversion process during normal system operation. Therefore the scope of this research was to develop on-line error detection schemes for analog-to-digital converters that can be implemented on a single integrated chip. There error-detection schemes suggested in here are highly dependent on the type of converter used in the design.

• Research Organization: Virginia Univ., Charlottesville, VA (USA)
• OSTI ID: 6093090
• Country of Publication: United States
• Language: English

Related Subjects

99 GENERAL AND MISCELLANEOUS
990200* -- Mathematics & Computers
ANALOG-TO-DIGITAL CONVERTERS
COMPUTERS
DESIGN
DIGITAL COMPUTERS
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
EQUIPMENT
ERRORS
FAULT TOLERANT COMPUTERS
INTEGRATED CIRCUITS
MICROELECTRONIC CIRCUITS
ON-LINE MEASUREMENT SYSTEMS
ON-LINE SYSTEMS