SNAP structures with Nb-AlO/sub x/-Nb junctions for MM wave receivers
Conference
·
· IEEE Trans. Magn.; (United States)
OSTI ID:6090797
High quality small area Nb-AlO/sub x/-Nb junctions have been fabricated by Selective Niobium Anodization Process (SNAP). The influence of the preparation conditions on the junctions properties were investigated. The numerical calculations based on IVCs measured by data acquisition system were used to simulate the mixer performance. It has been shown that the knee structure on the IVC of refractory material junctions affects significantly the signal properties of the mixer. The experimental investigation of the signal and noise properties for different types of the integrated SIS mixing elements have been performed in the frequency range of 37 - 53 GHz; the mixer conversion loss (SSB) was as low as 4 dB at 45 GHz. The mixing elements consist of the odd number of SIS junctions connected in series for RF and parallel for dc biasing have been tested. The dc bias wiring and IF filters of these structures were designed to provide tuning out of the junctions capacitance and thin film electrodes inductance. The advantages of these mixing elements to traditional series array have been demonstrated.
- Research Organization:
- Institute of Radio Engineering and Electronics, USSR Academy of Sciences, Marx Avenue 18, Moscow GSP-3 103907 (SU)
- OSTI ID:
- 6090797
- Report Number(s):
- CONF-880812-
- Conference Information:
- Journal Name: IEEE Trans. Magn.; (United States) Journal Volume: 25:2
- Country of Publication:
- United States
- Language:
- English
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High quality Nb-AlO sub x junctions for microwave receivers and SFQ logic device
Conference
·
Thu Feb 28 23:00:00 EST 1991
· IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)
·
OSTI ID:5690532
230 and 492 GHz low noise SIS waveguide receivers employing tuned Nb/AlO{sub x}/Nb tunnel junctions
Journal Article
·
Thu Nov 30 23:00:00 EST 1995
· International Journal of Infrared and Millimeter Waves
·
OSTI ID:244098
High quality Nb-AlO sub x junctions for microwave receivers and SFQ logic device
Conference
·
Thu Feb 28 23:00:00 EST 1991
· IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)
·
OSTI ID:6088845
Related Subjects
36 MATERIALS SCIENCE
360204 -- Ceramics
Cermets
& Refractories-- Physical Properties
420201* -- Engineering-- Cryogenic Equipment & Devices
656100 -- Condensed Matter Physics-- Superconductivity
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
99 GENERAL AND MISCELLANEOUS
990220 -- Computers
Computerized Models
& Computer Programs-- (1987-1989)
ALLOYS
ALUMINIUM COMPOUNDS
ALUMINIUM OXIDES
CALCULATION METHODS
CHALCOGENIDES
COMPUTERIZED SIMULATION
DATA
DATA ACQUISITION SYSTEMS
DESIGN
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELECTRODES
ELECTRONIC CIRCUITS
ELEMENTS
EXPERIMENTAL DATA
FABRICATION
FILMS
INFORMATION
INTEGRATED CIRCUITS
JUNCTIONS
METALS
MICROELECTRONIC CIRCUITS
NIOBIUM COMPOUNDS
NIOBIUM OXIDES
NUMERICAL DATA
NUMERICAL SOLUTION
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
REFRACTORY METAL COMPOUNDS
REFRACTORY METALS
SIMULATION
SUPERCONDUCTING FILMS
SUPERCONDUCTING JUNCTIONS
SUPERCONDUCTIVITY
TRANSITION ELEMENT COMPOUNDS
360204 -- Ceramics
Cermets
& Refractories-- Physical Properties
420201* -- Engineering-- Cryogenic Equipment & Devices
656100 -- Condensed Matter Physics-- Superconductivity
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
99 GENERAL AND MISCELLANEOUS
990220 -- Computers
Computerized Models
& Computer Programs-- (1987-1989)
ALLOYS
ALUMINIUM COMPOUNDS
ALUMINIUM OXIDES
CALCULATION METHODS
CHALCOGENIDES
COMPUTERIZED SIMULATION
DATA
DATA ACQUISITION SYSTEMS
DESIGN
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELECTRODES
ELECTRONIC CIRCUITS
ELEMENTS
EXPERIMENTAL DATA
FABRICATION
FILMS
INFORMATION
INTEGRATED CIRCUITS
JUNCTIONS
METALS
MICROELECTRONIC CIRCUITS
NIOBIUM COMPOUNDS
NIOBIUM OXIDES
NUMERICAL DATA
NUMERICAL SOLUTION
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
REFRACTORY METAL COMPOUNDS
REFRACTORY METALS
SIMULATION
SUPERCONDUCTING FILMS
SUPERCONDUCTING JUNCTIONS
SUPERCONDUCTIVITY
TRANSITION ELEMENT COMPOUNDS