Reliability estimates for large satellite memories in low earth orbits
Conference
·
OSTI ID:6083766
Los Alamos and Sandia National Laboratories are building an ultrasoft x-ray space telescope experiment, designed to be flown on a ''cheap-sat.'' Reliability estimates for the combined total dose and single event environments are given for the on-board memories as large as 1 gigabit. 4 refs., 4 figs., 1 tab.
- Research Organization:
- Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
- DOE Contract Number:
- W-7405-ENG-36
- OSTI ID:
- 6083766
- Report Number(s):
- LA-UR-89-489; CONF-890723-6; ON: DE89007764
- Resource Relation:
- Conference: 26. annual conference on nuclear and space radiation effects, Marco Island, FL, USA, 24 Jul 1989; Other Information: Paper copy only, copy does not permit microfiche production
- Country of Publication:
- United States
- Language:
- English
Similar Records
ALEXIS (Array of Low-Energy X-Ray Imaging Sensors): A narrow-band survey/monitor of the ultrasoft x-ray sky
An assessment of the radiation tolerance of large satellite memories in low earth orbits
On orbit performance of the ALEXIS EUV telescopes
Conference
·
Sun Jan 01 00:00:00 EST 1989
·
OSTI ID:6083766
+7 more
An assessment of the radiation tolerance of large satellite memories in low earth orbits
Conference
·
Tue Jan 01 00:00:00 EST 1991
·
OSTI ID:6083766
+1 more
On orbit performance of the ALEXIS EUV telescopes
Conference
·
Mon Aug 01 00:00:00 EDT 1994
·
OSTI ID:6083766
Related Subjects
42 ENGINEERING
99 GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE
MEMORY DEVICES
PHYSICAL RADIATION EFFECTS
DOSE RATES
MOS TRANSISTORS
ORBITS
RELIABILITY
SATELLITES
SOFT X RADIATION
ELECTROMAGNETIC RADIATION
IONIZING RADIATIONS
RADIATION EFFECTS
RADIATIONS
SEMICONDUCTOR DEVICES
TRANSISTORS
X RADIATION
420800* - Engineering- Electronic Circuits & Devices- (-1989)
990220 - Computers
Computerized Models
& Computer Programs- (1987-1989)
99 GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE
MEMORY DEVICES
PHYSICAL RADIATION EFFECTS
DOSE RATES
MOS TRANSISTORS
ORBITS
RELIABILITY
SATELLITES
SOFT X RADIATION
ELECTROMAGNETIC RADIATION
IONIZING RADIATIONS
RADIATION EFFECTS
RADIATIONS
SEMICONDUCTOR DEVICES
TRANSISTORS
X RADIATION
420800* - Engineering- Electronic Circuits & Devices- (-1989)
990220 - Computers
Computerized Models
& Computer Programs- (1987-1989)