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Soft x-ray circular dichroism and scattering using a modulated elliptically polarizing wiggler and double synchronous detection

Conference ·
OSTI ID:607504
We have constructed an experimental station (beamline) at the National Synchrotron Light Source to measure circular dichroism (CD) using soft x-rays (250 {le} hv {le} 900 eV) from a time modulated elliptically polarizing wiggler. The polarization of the soft x-ray beam switches periodically between two opposite polarizations, hence permitting the use of phase-sensitive (lock-in) detection. While the wiggler can be modulated at frequencies up to 100 Hz, switching transients limit the actual practical frequency to {approx}25 Hz. With analog detection, switching transients are blocked by a chopper synchronized to the frequency and phase of the wiggler. The CD is obtained from the ratio of the signal recovered at the frequency of polarization modulation, f, to the average beam intensity, which is recovered by synchronous detection at frequency 2f.
Research Organization:
Brookhaven National Lab., Upton, NY (United States)
Sponsoring Organization:
USDOE Office of Energy Research, Washington, DC (United States)
DOE Contract Number:
AC02-76CH00016
OSTI ID:
607504
Report Number(s):
BNL--65190; CONF-980117--; ON: DE98004367
Country of Publication:
United States
Language:
English

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