High sensitivity, one-sided x-ray inspection system. Final report, 20 November 1984-20 May 1985
A backscatter x-ray imaging method for nondestructive testing was developed. The one-sided inspection technique, a slot camera, is much faster in response than previous backscatter methods. Delaminations in graphite-epoxy composites and other low atomic number materials have been detected. Wall thicknesses up to 7 cm thick have been interrogated. The results show the location (depth) and magnitude (separation width) of simulated delaminations throughout the entire wall. A disbond between two flat surfaces in contact was detected. Feasibility of the system was shown with film detectors. A fast-response electronic detector is proposed. The objective of this program was to demonstrate the feasibility of an x-ray inspection equipment capable of probing an inspection sample from only one side to detect delaminations, voids, cracks or foreign material through the thickness interrogated. The feasibility of a unique, patented x-ray slot camera that works by scattered radiation was demonstrated using film techniques. The unique capability of this slot camera is that it can obtain images of the internal structure of an object at depths of many centimeters (depending on the object density and the x-ray energy) with a sensitivity that is several orders of magnitude greater than past-developed scattered radiation cameras.
- Research Organization:
- Industrial Quality, Inc., Gaithersburg, MD (USA)
- OSTI ID:
- 6062953
- Report Number(s):
- AD-A-162567/2/XAB; IQI-R-85-0710
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
360300 -- Composite Materials-- (-1987)
42 ENGINEERING
420500* -- Engineering-- Materials Testing
BACKSCATTERING
CAMERAS
COMPOSITE MATERIALS
CRACKS
DENSITY
DEPTH
DIMENSIONS
ENERGY
FEASIBILITY STUDIES
FILMS
IMAGES
INDUSTRIAL RADIOGRAPHY
INSPECTION
MATERIALS
MATERIALS TESTING
NONDESTRUCTIVE TESTING
PHYSICAL PROPERTIES
SCATTERING
TESTING
THICKNESS
WALLS
WIDTH
X-RAY RADIOGRAPHY