Secondary emission monitors at the Bevatron-Bevalac
Secondary Emission Monitors (SEM) are used for high intensity, high energy beam fluence monitoring of heavy ions. The improved electronics and autozeroing of background noise has extended the useful factor is capacitive changes between the chamber foils, from acoustic and mechanical vibration. Usable levels are in the 10/sup 4/ particles per pulse range for C/sup 6/ ions. The secondary electron yield is proportional to 1/..beta../sup 2/. This gives an increase in yield of about a factor of 25 for injection energies over peak energies at the Bevatron. This enhanced yield has been exploited in designing relative intensity and position monitors that give usable signal levels while intercepting only a small percentage of the injected beam. The detector in this case is a wire grid. The output can be: (1) sum proportional to the beam intensity or as a time profile; (2) Split grids for a right-left monitor; (3) single wire scan for a spatial profile. These monitors give usable signals down to a level of 0.01 to 0.1 ..mu..A of injected beam.
- Research Organization:
- California Univ., Berkeley (USA). Lawrence Berkeley Lab.
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 6062942
- Report Number(s):
- LBL-8808; CONF-790327-71; TRN: 79-011471
- Resource Relation:
- Conference: IEEE particle accelerator conference, San Francisco, CA, USA, 12 Mar 1979
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BEVALAC
BEAM MONITORS
BEVATRON
SECONDARY EMISSION DETECTORS
PERFORMANCE
HEAVY ION ACCELERATORS
RADIATION MONITORS
ACCELERATORS
CYCLIC ACCELERATORS
MEASURING INSTRUMENTS
RADIATION DETECTORS
SYNCHROTRONS
430303* - Particle Accelerators- Experimental Facilities & Equipment
440101 - Radiation Instrumentation- General Detectors or Monitors & Radiometric Instruments