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Title: Secondary emission monitors at the Bevatron-Bevalac

Abstract

Secondary Emission Monitors (SEM) are used for high intensity, high energy beam fluence monitoring of heavy ions. The improved electronics and autozeroing of background noise has extended the useful factor is capacitive changes between the chamber foils, from acoustic and mechanical vibration. Usable levels are in the 10/sup 4/ particles per pulse range for C/sup 6/ ions. The secondary electron yield is proportional to 1/..beta../sup 2/. This gives an increase in yield of about a factor of 25 for injection energies over peak energies at the Bevatron. This enhanced yield has been exploited in designing relative intensity and position monitors that give usable signal levels while intercepting only a small percentage of the injected beam. The detector in this case is a wire grid. The output can be: (1) sum proportional to the beam intensity or as a time profile; (2) Split grids for a right-left monitor; (3) single wire scan for a spatial profile. These monitors give usable signals down to a level of 0.01 to 0.1 ..mu..A of injected beam.

Authors:
; ; ; ;
Publication Date:
Research Org.:
California Univ., Berkeley (USA). Lawrence Berkeley Lab.
OSTI Identifier:
6062942
Report Number(s):
LBL-8808; CONF-790327-71
TRN: 79-011471
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Conference
Resource Relation:
Conference: IEEE particle accelerator conference, San Francisco, CA, USA, 12 Mar 1979
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; BEVALAC; BEAM MONITORS; BEVATRON; SECONDARY EMISSION DETECTORS; PERFORMANCE; HEAVY ION ACCELERATORS; RADIATION MONITORS; ACCELERATORS; CYCLIC ACCELERATORS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SYNCHROTRONS; 430303* - Particle Accelerators- Experimental Facilities & Equipment; 440101 - Radiation Instrumentation- General Detectors or Monitors & Radiometric Instruments

Citation Formats

Barale, J.J., Crebbin, K.C., Lax, J.W., Richter, R.M., and Zajec, E. Secondary emission monitors at the Bevatron-Bevalac. United States: N. p., 1979. Web.
Barale, J.J., Crebbin, K.C., Lax, J.W., Richter, R.M., & Zajec, E. Secondary emission monitors at the Bevatron-Bevalac. United States.
Barale, J.J., Crebbin, K.C., Lax, J.W., Richter, R.M., and Zajec, E. Thu . "Secondary emission monitors at the Bevatron-Bevalac". United States. https://www.osti.gov/servlets/purl/6062942.
@article{osti_6062942,
title = {Secondary emission monitors at the Bevatron-Bevalac},
author = {Barale, J.J. and Crebbin, K.C. and Lax, J.W. and Richter, R.M. and Zajec, E.},
abstractNote = {Secondary Emission Monitors (SEM) are used for high intensity, high energy beam fluence monitoring of heavy ions. The improved electronics and autozeroing of background noise has extended the useful factor is capacitive changes between the chamber foils, from acoustic and mechanical vibration. Usable levels are in the 10/sup 4/ particles per pulse range for C/sup 6/ ions. The secondary electron yield is proportional to 1/..beta../sup 2/. This gives an increase in yield of about a factor of 25 for injection energies over peak energies at the Bevatron. This enhanced yield has been exploited in designing relative intensity and position monitors that give usable signal levels while intercepting only a small percentage of the injected beam. The detector in this case is a wire grid. The output can be: (1) sum proportional to the beam intensity or as a time profile; (2) Split grids for a right-left monitor; (3) single wire scan for a spatial profile. These monitors give usable signals down to a level of 0.01 to 0.1 ..mu..A of injected beam.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1979},
month = {2}
}

Conference:
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