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Performance of a PET detector module utilizing an array of silicon photodiodes to identify the crystal of interaction

Journal Article · · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
DOI:https://doi.org/10.1109/23.256708· OSTI ID:6062101
;  [1]; ; ; ;  [2]
  1. Lawrence Berkeley Lab., CA (United States)
  2. CTI, Inc., Knoxville, TN (United States)
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The authors initial performance results for a new multi-layer PET detector module consisting of an array of 3 mm square by 30 mm deep BGO crystals coupled on one end to a single photomultiplier tube and on the opposite end to an array of 3 mm square silicon photodiodes. The photomultiplier tube provides an accurate timing pulse and energy discrimination for all the crystals in the module, while the silicon photodiodes identify the crystal of interaction. When a single BGO crystal at +25 C is excited with 511 keV photons, the authors measure a photodiode signal centered at 700 electrons (e[sup [minus]]) with noise of 375 e[sup [minus]] fwhm. When a four crystal/photodiode module is excited with a collimated line source of 511 keV photons, the crystal of interaction is correctly identified 82% of the time. The misidentification rate can be greatly reduced and an 8 x 8 crystal/photodiode module constructed by using thicker depletion layer photodiodes or cooling to 0 C.
DOE Contract Number:
AC03-76SF00098
OSTI ID:
6062101
Journal Information:
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 40:4 part 1; ISSN 0018-9499; ISSN IETNAE
Country of Publication:
United States
Language:
English

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Related Subjects

550601* -- Medicine-- Unsealed Radionuclides in Diagnostics
62 RADIOLOGY AND NUCLEAR MEDICINE
ACCURACY
COMPUTERIZED TOMOGRAPHY
DIAGNOSTIC TECHNIQUES
EMISSION COMPUTED TOMOGRAPHY
IMAGE SCANNERS
PERFORMANCE TESTING
PHOTODIODES
POSITRON COMPUTED TOMOGRAPHY
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
TESTING
TOMOGRAPHY