X-ray absorption spectroscopy of laser-produced plasmas: A study of the experiment and data analysis

Journal Article · Sat Jul 01 00:00:00 EDT 1989 · Phys. Rev. A; (United States)

DOI:https://doi.org/10.1103/PhysRevA.40.330· OSTI ID:6059095

Balmer, J; Lewis, C L. S.; Corbett, R E; Robertson, E; Saadat, S; O'Neill, D; Kilkenny, J D; Back, C A; Lee, R W

The novel technique of point-projection backlighting is used to probe alaser-produced plasma. A spatially restricted source of x rays is created byirradiating a fiber which is used to backlight a plasma. Temporal resolution ofthe absorption spectrum is obtained by creating the backlight with a pulse thatis delayed in time from the main, plasma-producing, laser. The backlight canalso be of shorter duration than the main laser pulse providing for enhancedtime resolution and therefore less temporal averaging. The results forlow-/ital Z/ aluminum and silicon targets are presented. The low-/ital Z/absorption spectra using both low-/ital Z/ (e.g., aluminum) and high-/ital Z/(e.g., molybdenum) elements for backlighting are studied. A description of thistechnique and the analysis of the data obtained is presented.

• Research Organization: Institute for Applied Physics, University of Berne, Berne, Switzerland(CH); Department of Physics, Queen's University, Belfast BT7 1NN, Northern Ireland; L-473 Lawrence Livermore National Laboratory, Livermore, California 94550
• OSTI ID: 6059095
• Journal Information: Phys. Rev. A; (United States), Vol. 40:1
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
LASER-PRODUCED PLASMA
X-RAY SPECTROSCOPY
PLASMA DIAGNOSTICS
ALUMINIUM
BACKSCATTERING
PULSE TECHNIQUES
SILICON
TIME RESOLUTION
X-RAY SOURCES
ELEMENTS
EQUIPMENT
METALS
PLASMA
RADIATION SOURCES
RESOLUTION
SCATTERING
SEMIMETALS
SPECTROSCOPY
TIMING PROPERTIES
X-RAY EQUIPMENT
700102* - Fusion Energy- Plasma Research- Diagnostics