NIST x-ray photoelectron spectroscopy (XPS) data base. Technical note (Final)
Technical Report
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OSTI ID:6046846
The technique known as XPS (X-Ray Photoelectron Spectroscopy) involves x-ray irradiation of surface samples under high vacuum. Electrons escaping from the samples are sorted and arranged to form a spectrum. A compilation of data for binding energy and kinetic energy of sample electrons from all elements has been collected. Depending on the nature of the chemical bond, the chemical shift can be as much as 10 eV. Over the past 6 years the author has indexed articles related to the subject area. The data bank contains a total of 13,200 records, from a total of 800 papers.
- Research Organization:
- National Inst. of Standards and Technology, Gaithersburg, MD (United States)
- OSTI ID:
- 6046846
- Report Number(s):
- PB-92-123157/XAB; NIST/TN-1289
- Resource Relation:
- Other Information: Also available from Supt. of Docs. as SN003-003-03104-6. Prepared in cooperation with Surfex Co., Oakland, CA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
PHOTOELECTRON SPECTROSCOPY
BIBLIOGRAPHIES
AUGER EFFECT
BINDING ENERGY
CHEMICAL SHIFT
KINETIC ENERGY
X RADIATION
DOCUMENT TYPES
ELECTROMAGNETIC RADIATION
ELECTRON SPECTROSCOPY
ENERGY
IONIZING RADIATIONS
RADIATIONS
SPECTROSCOPY
400102* - Chemical & Spectral Procedures
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
PHOTOELECTRON SPECTROSCOPY
BIBLIOGRAPHIES
AUGER EFFECT
BINDING ENERGY
CHEMICAL SHIFT
KINETIC ENERGY
X RADIATION
DOCUMENT TYPES
ELECTROMAGNETIC RADIATION
ELECTRON SPECTROSCOPY
ENERGY
IONIZING RADIATIONS
RADIATIONS
SPECTROSCOPY
400102* - Chemical & Spectral Procedures