NIST x-ray photoelectron spectroscopy (XPS) data base. Technical note (Final)

Technical Report · Tue Oct 01 00:00:00 EDT 1991

OSTI ID:6046846

Wagner, C D

The technique known as XPS (X-Ray Photoelectron Spectroscopy) involves x-ray irradiation of surface samples under high vacuum. Electrons escaping from the samples are sorted and arranged to form a spectrum. A compilation of data for binding energy and kinetic energy of sample electrons from all elements has been collected. Depending on the nature of the chemical bond, the chemical shift can be as much as 10 eV. Over the past 6 years the author has indexed articles related to the subject area. The data bank contains a total of 13,200 records, from a total of 800 papers.

• Research Organization: National Inst. of Standards and Technology, Gaithersburg, MD (United States)
• OSTI ID: 6046846
• Report Number(s): PB-92-123157/XAB; NIST/TN--1289
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400102* -- Chemical & Spectral Procedures
AUGER EFFECT
BIBLIOGRAPHIES
BINDING ENERGY
CHEMICAL SHIFT
DOCUMENT TYPES
ELECTROMAGNETIC RADIATION
ELECTRON SPECTROSCOPY
ENERGY
IONIZING RADIATIONS
KINETIC ENERGY
PHOTOELECTRON SPECTROSCOPY
RADIATIONS
SPECTROSCOPY
X RADIATION