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Title: Contrast between the chemical, structural and electronic properties of thin films of Cu and Ni on the Ru(0001) surface

Conference ·
OSTI ID:6039019

Studies of the structural and electronic properties of thin Cu films on the Ru(0001) surface have revealed features which mirror the unique chemical behavior found for this bimetallic system. The interesting chemical behavior occurs in the submonolayer and ML regime where low-energy electron diffraction (LEED) studies have showed that Cu adopts a pseudomorphic structure, implying that the overlayer is under a 6% strain. Photoemission studies have shown electronic properties for the pseudomorphic layer unlike those found for either bulk Ru(0001) or Cu(111). We expanded the Cu/Ru(0001) work to include a comparison with the Ni/Ru(0001) bimetallic system. We compared the results of LEED, angle-resolved photoemission, thermal-programmed desorption and work-function measurements. 7 refs., 1 fig.

Research Organization:
Sandia National Labs., Albuquerque, NM (USA)
DOE Contract Number:
AC04-76DP00789
OSTI ID:
6039019
Report Number(s):
SAND-87-1308C; CONF-871125-11; ON: DE88002360
Resource Relation:
Conference: 34. national vacuum symposium and topical conference, Anaheim, CA, USA, 2 Nov 1987; Other Information: Portions of this document are illegible in microfiche products
Country of Publication:
United States
Language:
English