Contrast between the chemical, structural and electronic properties of thin films of Cu and Ni on the Ru(0001) surface

Conference · Thu Jan 01 04:00:00 EST 1987

OSTI ID:6039019

Houston, J E; Berlowitz, P J; White, J M; Goodman, D W

Studies of the structural and electronic properties of thin Cu films on the Ru(0001) surface have revealed features which mirror the unique chemical behavior found for this bimetallic system. The interesting chemical behavior occurs in the submonolayer and ML regime where low-energy electron diffraction (LEED) studies have showed that Cu adopts a pseudomorphic structure, implying that the overlayer is under a 6% strain. Photoemission studies have shown electronic properties for the pseudomorphic layer unlike those found for either bulk Ru(0001) or Cu(111). We expanded the Cu/Ru(0001) work to include a comparison with the Ni/Ru(0001) bimetallic system. We compared the results of LEED, angle-resolved photoemission, thermal-programmed desorption and work-function measurements. 7 refs., 1 fig.

• Research Organization: Sandia National Labs., Albuquerque, NM (USA)
• DOE Contract Number: AC04-76DP00789
• OSTI ID: 6039019
• Report Number(s): SAND-87-1308C; CONF-871125-11; ON: DE88002360
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360204* -- Ceramics
Cermets
& Refractories-- Physical Properties
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400201 -- Chemical & Physicochemical Properties
BINDING ENERGY
BRILLOUIN ZONES
CHEMICAL PROPERTIES
COHERENT SCATTERING
COMPARATIVE EVALUATIONS
COPPER
DEPOSITION
DESORPTION
DIFFRACTION
ELECTRICAL PROPERTIES
ELECTRON DIFFRACTION
ELECTRONIC STRUCTURE
ELEMENTS
EMISSION
ENERGY
FILMS
INTERFACES
KINETICS
METALS
NICKEL
PHOTOEMISSION
PHYSICAL PROPERTIES
PLATINUM METALS
REACTION KINETICS
RUTHENIUM
SCATTERING
SECONDARY EMISSION
SURFACE COATING
SURFACES
THIN FILMS
TRANSITION ELEMENTS
ZONES