High spatial resolution soft-x-ray microscopy
- Ernest Orlando Lawrence Berkeley National Lab., CA (United States); and others
A new soft x-ray microscope (XM-1) with high spatial resolution has been constructed by the Center for X-ray Optics. It uses bending magnet radiation from beamline 6.1 at the Advanced Light Source, and is used in a variety of projects and applications in the life and physical sciences. Most of these projects are ongoing. The instrument uses zone plate lenses and achieves a resolution of 43 nm, measured over 10% to 90% intensity with a knife edge test sample. X-ray microscopy permits the imaging of relatively thick samples, up to 10 {mu}m thick, in water. XM-1 has an easy to use interface, that utilizes visible light microscopy to precisely position and focus the specimen. The authors describe applications of this device in the biological sciences, as well as in studying industrial applications including structured polymer samples.
- Research Organization:
- Lawrence Berkeley Lab., CA (United States)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 603448
- Report Number(s):
- LBNL--39981; ON: DE97007345
- Country of Publication:
- United States
- Language:
- English
Similar Records
X-ray Microscopy Resource Center at the Advanced Light Source
X-ray Microscopy Resource Center at the Advanced Light Source
Determination of the resolution of the x-ray microscope XM-1 at beamline 6.1
Conference
·
Sat Aug 01 00:00:00 EDT 1992
·
OSTI ID:10144431
X-ray Microscopy Resource Center at the Advanced Light Source
Conference
·
Sat Aug 01 00:00:00 EDT 1992
·
OSTI ID:6603919
Determination of the resolution of the x-ray microscope XM-1 at beamline 6.1
Technical Report
·
Mon Mar 31 23:00:00 EST 1997
·
OSTI ID:603446