High resolution X - gamma-ray spectrometry at high counting rates using high purity germanium detectors
Conference
·
· IEEE Trans. Nucl. Sci.; (United States)
OSTI ID:6031438
One of the limitations in achieving high energy resolution in X and gamma-ray spectrometers at high counting rates is incomplete charge collection in the germanium detector. In this paper the authors discuss some of the limiting factors which are relevant in detector fabrication and in the optical reset configurations in the input integrator circuit and the associated electronic processing. Experimental results demonstrate input counting rates up to 1.5 million counts per sec without any serious degradation in energy resolution.
- Research Organization:
- Instrumentation and Applied Physics Div., AERE Harwell, Oxon 0X11 0RA
- OSTI ID:
- 6031438
- Report Number(s):
- CONF-851009-
- Conference Information:
- Journal Name: IEEE Trans. Nucl. Sci.; (United States) Journal Volume: NS-33:1
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
440101 -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments
440103* -- Radiation Instrumentation-- Nuclear Spectroscopic Instrumentation
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHARGE COLLECTION
COUNTING RATES
ELECTRONIC CIRCUITS
ENERGY RESOLUTION
FABRICATION
GAMMA SPECTROMETERS
GAMMA SPECTROSCOPY
GE SEMICONDUCTOR DETECTORS
HIGH-PURITY GE DETECTORS
INTEGRATED CIRCUITS
MEASURING INSTRUMENTS
MICROELECTRONIC CIRCUITS
RADIATION DETECTORS
RESOLUTION
SEMICONDUCTOR DETECTORS
SPECTROMETERS
SPECTROSCOPY
X-RAY SPECTROMETERS
X-RAY SPECTROSCOPY
440103* -- Radiation Instrumentation-- Nuclear Spectroscopic Instrumentation
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHARGE COLLECTION
COUNTING RATES
ELECTRONIC CIRCUITS
ENERGY RESOLUTION
FABRICATION
GAMMA SPECTROMETERS
GAMMA SPECTROSCOPY
GE SEMICONDUCTOR DETECTORS
HIGH-PURITY GE DETECTORS
INTEGRATED CIRCUITS
MEASURING INSTRUMENTS
MICROELECTRONIC CIRCUITS
RADIATION DETECTORS
RESOLUTION
SEMICONDUCTOR DETECTORS
SPECTROMETERS
SPECTROSCOPY
X-RAY SPECTROMETERS
X-RAY SPECTROSCOPY