Charging dynamics of dielectrics irradiated by low energy electrons

Conference · Thu Aug 01 04:00:00 EDT 1985 · IEEE Trans. Nucl. Sci.; (United States)

OSTI ID:6017981

von Seggern, H

A recent study by Gross et al. showed the possibility of positive charging of dielectric materials by low energy electron irradiation. In this paper we model the charging process allowing us to predict the voltage buildup or decay and the corresponding charging currents under various initial potential conditions of the dielectric. The model incorporates the secondary electron emission (SEE) yield curve and the energy distribution of the secondaries. The energy distribution is essential to obtain the correct charging behavior for beam energies smaller than the second crossover energy of the SEE yield curve. The results agree, in general, with experimental data. Further it is shown theoretically that knowledge of the charging current and the corresponding voltage behavior of an irradiated sample can be utilized to determine the secondary electron yield curve for dielectrics and conductors.

• Research Organization: ATandT Bell Laboratories, Murray Hill, NJ
• OSTI ID: 6017981
• Report Number(s): CONF-850579-
• Conference Information: Journal Name: IEEE Trans. Nucl. Sci.; (United States) Journal Volume: NS-32:4
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360206* -- Ceramics
Cermets
& Refractories-- Radiation Effects
BEAM CURRENTS
BEAM DYNAMICS
BEAMS
CURRENTS
DIELECTRIC MATERIALS
ELECTRIC CHARGES
ELECTRIC POTENTIAL
ELECTRON BEAMS
ELECTRON EMISSION
EMISSION
ENERGY SPECTRA
IRRADIATION
LEPTON BEAMS
MATERIALS
MATHEMATICAL MODELS
PARTICLE BEAMS
SECONDARY EMISSION
SPECTRA