Electromechanical resonances in ceramic capacitors and evaluation of the piezoelectric materials' properties
- North American Philips Corp., Briarcliff Manor, NY (USA)
Impedance measurements as a function of frequency on ceramic capacitors with X7R and Z5U temperature characteristics show electromechanical resonances which are caused by the piezoelectric nature of the BaTiO{sub 3}-based dielectric materials. In contrast to BaTiO{sub 3}-based transducer materials, the dielectric materials cannot be permanently poled. Therefore, the resonances can only be observed during the application of a bias voltage. Resonances associated with the length, width, and thickness of the capacitor are clearly identified. Measurement of the characteristics of the width resonance as a function of bias field show that the dielectric ceramic is stiffened by the application of a bias field. The quality factor has a maximum at 200 V and 50 V for the X7R and Z5U capacitors, respectively. The materials constants for the dielectric materials derived from the width resonance are comparable to those published for BaTiO{sub 3}-based transducer materials.
- OSTI ID:
- 6014515
- Journal Information:
- Advanced Ceramic Materials; (USA), Journal Name: Advanced Ceramic Materials; (USA) Vol. 2:2; ISSN 0883-5551; ISSN ACEME
- Country of Publication:
- United States
- Language:
- English
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360204* -- Ceramics
Cermets
& Refractories-- Physical Properties
ALKALINE EARTH METAL COMPOUNDS
BARIUM COMPOUNDS
BARIUM OXIDES
CAPACITORS
CHALCOGENIDES
DATA
DIELECTRIC MATERIALS
ELECTRIC IMPEDANCE
ELECTRICAL EQUIPMENT
ELECTRICITY
EQUIPMENT
EXPERIMENTAL DATA
FREQUENCY DEPENDENCE
IMPEDANCE
INFORMATION
MATERIALS
NUMERICAL DATA
OXIDES
OXYGEN COMPOUNDS
PIEZOELECTRICITY
TITANIUM COMPOUNDS
TITANIUM OXIDES
TRANSITION ELEMENT COMPOUNDS