Growth characterization of YBa/sub 2/Cu/sub 3/O/sub 7/minus///sub /ital x// thin films on (100) MgO

Journal Article · Mon Jul 17 04:00:00 EDT 1989 · Appl. Phys. Lett.; (United States)

DOI:https://doi.org/10.1063/1.102413· OSTI ID:6011791

Li, Q; Meyer, O; Xi, X X; Geerk, J; Linker, G

The growth features of YBa/sub 2/Cu/sub 3/O/sub 7/minus///sub /ital x// thin films on (100) MgO substrates were studied by He ion channeling and x-ray diffraction measurements. A minimum yield value of 7% at 2 MeV He ion energy and a standard deviation of the crystallite misorientation of only 0.1/degree/ show that epitaxial growth (/ital c/-axis oriented) is achieved despite a large lattice mismatch of about 9% between the film and the substrate. Detailed studies of the energy dependence of the dechanneling yield at the film-substrate interface for films of different thickness reveal the presence of dislocations probably formed by strain relief in the initial state of growth. Stacking faults appear as the main defect structure in the bulk of the films.

• Research Organization: Kernforschungszentrum Karlsruhe, Institut f ur Nukleare Festkorperphysik, P. O. Box 3640, D-7500 Karlsruhe, Federal Republic of Germany (DE)
• OSTI ID: 6011791
• Journal Information: Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 55:3; ISSN APPLA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360201 -- Ceramics
Cermets
& Refractories-- Preparation & Fabrication
360202 -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
360204* -- Ceramics
Cermets
& Refractories-- Physical Properties
656100 -- Condensed Matter Physics-- Superconductivity
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALKALINE EARTH METAL COMPOUNDS
BACKSCATTERING
BARIUM COMPOUNDS
BARIUM OXIDES
CHALCOGENIDES
CHANNELING
COHERENT SCATTERING
COPPER COMPOUNDS
COPPER OXIDES
CRITICAL CURRENT
CRYSTAL DEFECTS
CRYSTAL GROWTH
CRYSTAL STRUCTURE
CURRENTS
DATA
DIFFRACTION
DIMENSIONS
DISLOCATIONS
ELECTRIC CONDUCTIVITY
ELECTRIC CURRENTS
ELECTRICAL PROPERTIES
ENERGY RANGE
EPITAXY
EXPERIMENTAL DATA
FILMS
INFORMATION
ION CHANNELING
LINE DEFECTS
LOW TEMPERATURE
MEV RANGE
MEV RANGE 01-10
MONTE CARLO METHOD
NUMERICAL DATA
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
SCATTERING
STACKING FAULTS
STRAINS
STRONTIUM COMPOUNDS
STRONTIUM OXIDES
SUPERCONDUCTING FILMS
SUPERCONDUCTIVITY
THERMODYNAMIC PROPERTIES
THICKNESS
THIN FILMS
TITANIUM COMPOUNDS
TITANIUM OXIDES
TRANSITION ELEMENT COMPOUNDS
TRANSITION TEMPERATURE
VAPOR PHASE EPITAXY
X-RAY DIFFRACTION
YTTRIUM COMPOUNDS
YTTRIUM OXIDES