The short bunch blow-out regime in RF photoinjectors

Journal Article · Sun Jun 01 04:00:00 EDT 1997 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.54425· OSTI ID:600958

Serafini, L ^[1]

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1. INFN and Universita di Milano, Via Celoria 16, 20133Milano (Italy)

A new beam dynamics regime of RF Photoinjectors is presented here, dealing with a violent bunch elongation under the action of longitudinal space charge forces. It is shown that such a blow-out expansion of the electron bunch can lead to highly linear behaviors of both the longitudinal and the transverse space charge field, a well known prerequisite to achieve minimum emittance dilution in photoinjectors. If operated in the ultra-short pancake-like bunch regime, such an effect can be very beneficial to the emittance correction mechanism, making it effective also for ultra-short pancake like bunches. The anticipated performances are presented: kA peak current beams can be generated directly out of the photoinjector (10 to 20 MeV exit energy) with rms normalized emittances below 1mm{center_dot}mrad. {copyright} {ital 1997 American Institute of Physics.}

• Sponsoring Organization: USDOE
• OSTI ID: 600958
• Report Number(s): CONF-9706244--
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 413; ISSN 0094-243X; ISSN APCPCS
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
BEAM DYNAMICS
ELECTRON BEAM INJECTION
ELECTRON GUNS
FLUCTUATIONS
FREE ELECTRON LASERS
PHASE SPACE
PHOTOCATHODES
RF SYSTEMS
SPACE CHARGE
X-RAY LASERS