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Computer simulation of schlieren images of rotationally symmetric plasma systems: a simple method

Journal Article · · Appl. Opt.; (United States)
DOI:https://doi.org/10.1364/AO.25.000769· OSTI ID:6003216
Schlieren techniques are commonly used methods for quantitative analysis of cylindrical or spherical index of refraction profiles. Many schlieren objects, however, are characterized by more complex geometries, so we have investigated the more general case of noncylindrical, rotationally symmetric distributions of index of refraction n(r,z). Assuming straight ray paths in the schlieren object we have calculated 2-D beam deviation profiles. It is shown that experimental schlieren images of the noncylindrical plasma generated by a plasma focus device can be simulated with these deviation profiles. The computer simulation allows a quantitative analysis of these schlieren images, which yields, for example, the plasma parameters, electron density and electron density gradients.
Research Organization:
Fraunhofer Institut fuer Laser-technik, Drosselweg 87, D-5100 Aachen, Federal Republic of Germany
OSTI ID:
6003216
Journal Information:
Appl. Opt.; (United States), Journal Name: Appl. Opt.; (United States) Vol. 25:5; ISSN APOPA
Country of Publication:
United States
Language:
English