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Design philosophy for high-resolution rate and throughput spectroscopy systems

Journal Article · · IEEE Trans. Nucl. Sci.; (United States)
The paper describes the philosophy behind the design of a pulse processing system used in a semiconductor detector x-ray spectrometer to be used for plasma diagnostics at the Princeton TFTR facility. This application presents the unusual problems of very high counting rates and a high-energy neutron background while still requiring excellent resolution. To meet these requirements, three specific new advances are included in the design: (i) A symmetrical triangular pulse shape is employed in the main pulse-processing channel. A new simple method of generating a close approximation to the symmetrical triangle has been developed. (ii) To cope with the very wide dynamic range of signals while maintaining a constant fast resolving time, approximately symmetrical triangular pulse shaping is also used in the fast pulse pile-up inspection channel. (iii) The demand for high throughput has resulted in a re-examination of the operation of pile-up rejectors and pulse stretchers. As a result a technique has been developed that, for a given total pulse shaping time, permits approximately a 40% increase in throughput in the system. Performance results obtained using the new techniques are presented.
Research Organization:
Lawrence Berkeley Laboratory, University of California, Berkeley, CA 94720
DOE Contract Number:
AC03-76SF00098
OSTI ID:
5990604
Journal Information:
IEEE Trans. Nucl. Sci.; (United States), Journal Name: IEEE Trans. Nucl. Sci.; (United States) Vol. 30:1; ISSN IETNA
Country of Publication:
United States
Language:
English