Electromigration failure in YBa sub 2 Cu sub 3 O sub 7 minus x thin films

Journal Article · Mon Feb 18 00:00:00 EST 1991 · Applied Physics Letters; (USA)

DOI:https://doi.org/10.1063/1.104539· OSTI ID:5978527

Vitta, S; Stan, M A; Warner, J D; Alterovitz, S A ^[1]

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1. NASA Lewis Research Center, Cleveland, Ohio 44135 (US)

Electromigration failure in highly oriented YBa{sub 2}Cu{sub 3}O{sub 7{minus}{ital x}} thin films below the superconducting transition temperature is reported here for the first time. The film on SrTiO{sub 3} failed at 86 K, 2.3{times}10{sup 5} A cm{sup {minus}2}; while that on LaAlO{sub 3} failed at 84 K, 9.3{times}10{sup 5} A cm{sup {minus}2}. Scanning electron microscopy and energy dispersive x-ray analysis of the films after failure shows that Cu migrates preferentially away from the failure region towards the electrode.

• OSTI ID: 5978527
• Journal Information: Applied Physics Letters; (USA), Vol. 58:7; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BARIUM OXIDES
ELECTROPHORESIS
COPPER OXIDES
YTTRIUM OXIDES
HIGH-TC SUPERCONDUCTORS
SUPERCONDUCTING FILMS
TRANSITION TEMPERATURE
ALKALINE EARTH METAL COMPOUNDS
BARIUM COMPOUNDS
CHALCOGENIDES
COPPER COMPOUNDS
FILMS
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
SUPERCONDUCTORS
THERMODYNAMIC PROPERTIES
TRANSITION ELEMENT COMPOUNDS
YTTRIUM COMPOUNDS
360204* - Ceramics
Cermets
& Refractories- Physical Properties