Nuclear reaction techniques in materials analysis

Journal Article · Sun Jan 01 04:00:00 EST 1984 · Annu. Rev. Nucl. Part. Sci.; (United States)

DOI:https://doi.org/10.1146/annurev.ns.34.120184.002251· OSTI ID:5977235

Amsel, G; Lanford, W A

This article discusses nuclear reaction microanalysis (NRA). In NRA, data accumulated in the frame of low-energy nuclear physics is put to advantage for analytical purposes. Unknown targets are bombarded and known reactions are observed. For NRA, the accelerator, detectors, spectrum recording and interpretation must be reliable, simple, and fast. Other MeV ion-beam analytical techniques are described which are complementary to NRA, such as Rutherford backscattering (RBS), proton-induced x-ray emission (PIXE), and the more recent method of elastic recoil detection (ERD). Applications for NRA range from solid-state physics and electrochemistry, semiconductor technology, metallurgy, materials science, and surface science to biology and archeology.

• Research Organization: Groupe de Physique des Solides de l'Ecole Normale Superieure, Paris
• OSTI ID: 5977235
• Journal Information: Annu. Rev. Nucl. Part. Sci.; (United States), Journal Name: Annu. Rev. Nucl. Part. Sci.; (United States) Vol. 34; ISSN ARPSD
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400101* -- Activation
Nuclear Reaction
Radiometric & Radiochemical Procedures
BACKSCATTERING
CHARGED PARTICLE DETECTION
CHARGED-PARTICLE REACTIONS
CHEMICAL ANALYSIS
DETECTION
ELASTIC SCATTERING
ION BEAM TARGETS
KINETICS
MATERIALS TESTING
MEASURING INSTRUMENTS
NEUTRON DETECTORS
NONDESTRUCTIVE ANALYSIS
NUCLEAR REACTION ANALYSIS
NUCLEAR REACTION KINETICS
NUCLEAR REACTIONS
PIXE ANALYSIS
PROTON RECOIL DETECTORS
RADIATION DETECTION
RADIATION DETECTORS
REACTION KINETICS
RUTHERFORD SCATTERING
SCATTERING
TARGETS
TESTING
ULTRAHIGH VACUUM
USES
X-RAY EMISSION ANALYSIS