Fluctuation conductivity of tin films below the superconducting transition temperature

Journal Article · Sun May 01 04:00:00 EDT 1983 · J. Low Temp. Phys.; (United States)

DOI:https://doi.org/10.1007/BF00683554· OSTI ID:5971050

Parashar, R S; Dheer, P N

Measurements have been carried out of the temperature dependence of the fluctuation-induced excess electrical conductivity of thin (thickness much less than the Ginzburg-Landau coherence length) superconducting films of tin below the transition temperature. Two types of specimen were investigated: (a) films deposited on a glass substrate held at 300 K and (b) films deposited on a glass substrate at 300 K and then covered by a protective layer of germanium. Special care was taken to ensure sample homogeneity. Analysis of the results shows that the fluctuation parameter, epsilon/sub c/, is not affected by the germanium layer. Its value is, however, much larger than that predicted by the theory of Kajimura, Micoshiba, and Yamaji.

• Research Organization: Department of Physics and Astrophysics, University of Delhi, Delhi, India
• OSTI ID: 5971050
• Journal Information: J. Low Temp. Phys.; (United States), Journal Name: J. Low Temp. Phys.; (United States) Vol. 51:3; ISSN JLTPA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360104* -- Metals & Alloys-- Physical Properties
656102 -- Solid State Physics-- Superconductivity-- Acoustic
Electronic
Magnetic
Optical
& Thermal Phenomena-- (-1987)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
DATA
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELECTRON MICROSCOPY
ELEMENTS
EXPERIMENTAL DATA
FILMS
FLUCTUATIONS
INFORMATION
METALS
MICROSCOPY
NUMERICAL DATA
PHYSICAL PROPERTIES
SUPERCONDUCTING FILMS
SUPERCONDUCTIVITY
TEMPERATURE DEPENDENCE
THERMODYNAMIC PROPERTIES
TIN
TRANSITION TEMPERATURE
VARIATIONS