Synthesis and characterization of SiC-reinforced silicon composites produced by chemical vapor deposition
Journal Article
·
· Advanced Ceramic Materials; (USA)
- Univ. of Connecticut, Storrs (USA)
- United Technologies Research Center, Hartford, CT (USA)
The goal of this study was to prepare SiC-reinforced silicon matrix composites. Chemical vapor deposition techniques were employed to deposit Si onto the surface of SiC fibers and to infiltrate silicon carbide fibers to form a cylindrical composite. A mixture of SiCl{sub 4} and H{sub 2} was reacted at 1,000{degree}C to produce the Si coating. The morphology of Si deposition was monitored by scanning electron microscopy. The structural properties of the composite were studied by powder x-ray diffraction methods. Surface studies of the composites were investigated with x-ray photoelectron spectroscopy.
- OSTI ID:
- 5962669
- Journal Information:
- Advanced Ceramic Materials; (USA), Journal Name: Advanced Ceramic Materials; (USA) Vol. 3:6; ISSN 0883-5551; ISSN ACEME
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
360601* -- Other Materials-- Preparation & Manufacture
360602 -- Other Materials-- Structure & Phase Studies
CARBIDES
CARBON COMPOUNDS
CHEMICAL COATING
CHEMICAL VAPOR DEPOSITION
COATINGS
COHERENT SCATTERING
CRYSTAL STRUCTURE
DATA
DEPOSITION
DIFFRACTION
ELECTRON MICROSCOPY
ELECTRON SPECTROSCOPY
EXPERIMENTAL DATA
INFORMATION
MICROSCOPY
MICROSTRUCTURE
NUMERICAL DATA
PHOTOELECTRON SPECTROSCOPY
SCANNING ELECTRON MICROSCOPY
SCATTERING
SILICON CARBIDES
SILICON COMPOUNDS
SPECTROSCOPY
SURFACE COATING
VAPOR DEPOSITED COATINGS
VERY HIGH TEMPERATURE
X-RAY DIFFRACTION
360601* -- Other Materials-- Preparation & Manufacture
360602 -- Other Materials-- Structure & Phase Studies
CARBIDES
CARBON COMPOUNDS
CHEMICAL COATING
CHEMICAL VAPOR DEPOSITION
COATINGS
COHERENT SCATTERING
CRYSTAL STRUCTURE
DATA
DEPOSITION
DIFFRACTION
ELECTRON MICROSCOPY
ELECTRON SPECTROSCOPY
EXPERIMENTAL DATA
INFORMATION
MICROSCOPY
MICROSTRUCTURE
NUMERICAL DATA
PHOTOELECTRON SPECTROSCOPY
SCANNING ELECTRON MICROSCOPY
SCATTERING
SILICON CARBIDES
SILICON COMPOUNDS
SPECTROSCOPY
SURFACE COATING
VAPOR DEPOSITED COATINGS
VERY HIGH TEMPERATURE
X-RAY DIFFRACTION