Magnetic circular dichroism in x-ray absorption for well characterized Fe/Pt multilayers

Journal Article · Wed Dec 01 04:00:00 EST 1993 · Journal of Applied Physics; (United States)

DOI:https://doi.org/10.1063/1.355055· OSTI ID:5961633

Waddill, G D; Tobin, J G; Jankowski, A F ^[1]

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1. Chemistry and Materials Science Department, Lawrence Livermore National Laboratory, P.O. Box 808, Livermore, California 94550 (United States)

The subtle structure-property relationship in magnetic multilayers is addressed by an array of techniques. Fe/Pt multilayers prepared by magnetron sputter deposition are characterized using x-ray diffraction, Auger depth profiling, electron microscopy, magnetometry, and x-ray magnetic circular dichroism. We concentrate on the (Fe[sub 9]/Pt[sub 9])[sub 92] which is [111] textured in the growth direction, but randomly oriented in-plane, with average grain size of 30 nm. This sample is magnetized in-plane, as determined by magnetometry as well as magnetic circular dichroism (MCD). The potential of MCD to follow the magnetic axis orientation in these samples as well as provide an element specific determination of the magnetic moment will be discussed.

• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 5961633
• Journal Information: Journal of Applied Physics; (United States), Journal Name: Journal of Applied Physics; (United States) Vol. 74:11; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360104* -- Metals & Alloys-- Physical Properties
ABSORPTION SPECTRA
COHERENT SCATTERING
DICHROISM
DIFFRACTION
ELEMENTS
FILMS
GRAIN SIZE
IRON
LATTICE PARAMETERS
MAGNETIC CIRCULAR DICHROISM
MAGNETIZATION
METALS
MICROSTRUCTURE
PLATINUM
PLATINUM METALS
SCATTERING
SIZE
SPECTRA
SPUTTERING
THIN FILMS
TRANSITION ELEMENTS
X-RAY DIFFRACTION
X-RAY SPECTRA