Charging and discharging characteristics of dielectric materials exposed to low- and mid-energy electrons
Samples of dielectric materials have been irradiated with low- (1 to 25 keV) and mid-energy (25 to 100 keV) electrons. Charging and discharging characteristics for samples of OSR, mylar, Kapton, perforated Kapton and Alphaquartz are discussed. Results of tests conducted with monoenergetic midenergy electrons indicate that the worst-case peak discharge current, l /SUB s/ , is relatively constant with exposure energy; that dl /SUB s/ /dt is relatively constant with exposure energy; and that the predischarge surface potential, V /SUB i/ , is only a weak function of energy. Results of irradiating samples of OSR, mylar, and Kapton with low-energy and mid-energy electrons indicate that the surface potential may be tailored to low values (V /SUB s/ <2 kV) and yet still achieve discharges (on OSR and mylar samples), and that for an OSR sample, the frequency content of these discharges is much higher than for discharges observed during exposure to monoenergetic low-energy electrons alone.
- Research Organization:
- JAYCOR, San Diego, CA
- OSTI ID:
- 5961080
- Journal Information:
- IEEE Trans. Nucl. Sci.; (United States), Journal Name: IEEE Trans. Nucl. Sci.; (United States) Vol. 29:6; ISSN IETNA
- Country of Publication:
- United States
- Language:
- English
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46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHALCOGENIDES
DIELECTRIC MATERIALS
DOSES
ELECTRONS
ELEMENTARY PARTICLES
ESTERS
FERMIONS
IRRADIATION
LEPTONS
MATERIALS
MINERALS
MYLAR
ORGANIC COMPOUNDS
ORGANIC POLYMERS
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
PEAK LOAD
PETROCHEMICALS
PETROLEUM PRODUCTS
PHYSICAL RADIATION EFFECTS
PLASTICS
POLYESTERS
POLYMERS
POTENTIALS
QUARTZ
RADIATION DOSES
RADIATION EFFECTS
REACTOR FUELING
SILICON COMPOUNDS
SILICON OXIDES
SYNTHETIC MATERIALS