Polychromatic x-ray source for diffraction apparatus using polychromatic x-rays
A polychromatic x-ray source used in a polychromatic x-ray diffraction apparatus is described. The polychromatic x-rays are cast upon a sample to be analyzed, the energies of the x-rays diffracted from the crystallographic planes of the sample are measured and the physical properties of the sample are detected on the basis of the measured energies. The polychromatic x-ray source has a container made of radiation shielding material and having an x-ray outlet channel and the container contains therein a radionuclide for emitting radioactive rays and a substance for scattering and absorbing the radioactive rays emitted from the substance so as to obtain polychromatic x-rays. The polychromatic x-rays emitted from the substance travel through the x-ray outlet channel and are then made parallel through a soller slit to be cast upon the sample. A slide door is provided in the channel so as to block the polychromatic x-rays if necessary.
- Assignee:
- Hitachi Ltd (Japan)
- Patent Number(s):
- US 4284887
- OSTI ID:
- 5953878
- Resource Relation:
- Patent Priority Date: Priority date 16 Mar 1978, Japan
- Country of Publication:
- United States
- Language:
- English
Similar Records
The Future of Spatially-Resolved Polychromatic Neutron and X-Ray Microdiffraction
Polychromatic X-ray Micro- and Nanodiffraction for Spatially-Resolved Structural Studies
Related Subjects
X-RAY DIFFRACTOMETERS
X-RAY SOURCES
DESIGN
X-RAY EMISSION ANALYSIS
COLLIMATORS
COLOR
GAMMA RADIATION
X RADIATION
CHEMICAL ANALYSIS
DIFFRACTOMETERS
ELECTROMAGNETIC RADIATION
EQUIPMENT
IONIZING RADIATIONS
MEASURING INSTRUMENTS
NONDESTRUCTIVE ANALYSIS
OPTICAL PROPERTIES
ORGANOLEPTIC PROPERTIES
PHYSICAL PROPERTIES
RADIATION SOURCES
RADIATIONS
X-RAY EQUIPMENT
440100* - Radiation Instrumentation