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Title: Polychromatic x-ray source for diffraction apparatus using polychromatic x-rays

Patent ·
OSTI ID:5953878

A polychromatic x-ray source used in a polychromatic x-ray diffraction apparatus is described. The polychromatic x-rays are cast upon a sample to be analyzed, the energies of the x-rays diffracted from the crystallographic planes of the sample are measured and the physical properties of the sample are detected on the basis of the measured energies. The polychromatic x-ray source has a container made of radiation shielding material and having an x-ray outlet channel and the container contains therein a radionuclide for emitting radioactive rays and a substance for scattering and absorbing the radioactive rays emitted from the substance so as to obtain polychromatic x-rays. The polychromatic x-rays emitted from the substance travel through the x-ray outlet channel and are then made parallel through a soller slit to be cast upon the sample. A slide door is provided in the channel so as to block the polychromatic x-rays if necessary.

Assignee:
Hitachi Ltd (Japan)
Patent Number(s):
US 4284887
OSTI ID:
5953878
Resource Relation:
Patent Priority Date: Priority date 16 Mar 1978, Japan
Country of Publication:
United States
Language:
English