Photoabsorption cross section of XeF/sub 2/ from 150 to 275 nm by forward-scattering electron energy-loss spectroscopy

Journal Article · Tue Dec 15 04:00:00 EST 1987 · J. Appl. Phys.; (United States)

DOI:https://doi.org/10.1063/1.339798· OSTI ID:5948462

Spence, D; Tanaka, H; Dillon, M A

Using the technique of high-incident-energy forward-scattering electron energy-loss spectroscopy, we have derived the relative photoabsorption cross section of xenon difluoride from 150 to 275 nm. Normalization of our data to two previous measurements which used conventional photoabsorption techniques shows good agreement with an early measurement over the entire spectral range, but significant disagreement with more recent data for wavelengths greater than 175 nm.

• Research Organization: Argonne National Laboratory, Argonne, Illinois 60439
• DOE Contract Number: W-31109-ENG-38
• OSTI ID: 5948462
• Journal Information: J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 62:12; ISSN JAPIA
• Country of Publication: United States
• Language: English

Related Subjects

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Molecular & Chemical Physics-- Atomic & Molecular Properties & Theory
640304* -- Atomic
Molecular & Chemical Physics-- Collision Phenomena
74 ATOMIC AND MOLECULAR PHYSICS
CHLORIDES
CHLORINE COMPOUNDS
COLLISIONS
CROSS SECTIONS
DATA
ELECTROMAGNETIC RADIATION
ELECTRON COLLISIONS
ELECTRON SPECTROSCOPY
ELECTRON-MOLECULE COLLISIONS
ENERGY-LOSS SPECTROSCOPY
EXPERIMENTAL DATA
HALIDES
HALOGEN COMPOUNDS
INFORMATION
MOLECULE COLLISIONS
NUMERICAL DATA
OPACITY
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
RADIATIONS
RARE GAS COMPOUNDS
SCATTERING
SPECTROSCOPY
ULTRAVIOLET RADIATION
XENON CHLORIDES
XENON COMPOUNDS