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Title: Silicon micromachining based on porous silicon formation

Conference ·
OSTI ID:5947363

We describe a new electrochemical processing technique based on porous silicon formation that can produce surface and buried insulators, conductors, and sacrificial layers required for silicon micromachining to fabricate micromechanical devices and sensors. Porosity and thickness of porous silicon layers for micromachining can be controlled to a relative precision better than 0.3% for porosities ranging from 20--80% and thicknesses ranging from sub- micron to hundreds of microns. The technique of using porous silicon has important implications for microfabrication of silicon electromechanical devices and sensors. The high relative precision in realizing a given thickness is superior to that obtained with conventional chemical etches. 8 refs.

Research Organization:
Sandia National Labs., Albuquerque, NM (United States)
Sponsoring Organization:
USDOE; USDOE, Washington, DC (United States)
DOE Contract Number:
AC04-76DP00789
OSTI ID:
5947363
Report Number(s):
SAND-91-0910C; CONF-911047-3; ON: DE92005178
Resource Relation:
Conference: 180. meeting of the Electrochemical Society, Phoenix, AZ (United States), 13-18 Oct 1991
Country of Publication:
United States
Language:
English