skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: A digital front-end and readout microsystem for calorimetry at LHC--The FERMI project

Conference · · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:5946291
; ; ;  [1]; ;  [2];  [3]; ; ; ; ; ; ;  [4]; ; ;  [5]; ; ; more »;  [6]; ; ;  [7]; ; ; ;  [8];  [9] « less
  1. CERN, Geneva (Switzerland)
  2. Univ. of Linkoeping (Sweden). Dept. of Physics and Measurement Technology
  3. Univ. of Linkoeping (Sweden). Center for Industrial Microelectronics and Materials Technology
  4. Sezione INFN, Pavia, Milano (Italy). Dept. di Ellettronica
  5. Univ. e Sezione INFN, Pavia (Italy). Dept. di Fisica Nucleare
  6. Univ. e Sezione INFN, Pavia (Italy). Dept. di Electronica
  7. Manne Siegbahn Inst. of Physics, Stockholm (Sweden)
  8. Univ. of Stockholm (Sweden)
  9. SiCon AB, Linkoeping (Sweden)

The authors present a digital solution to the front-end electronics for calorimetric detectors at future supercolliders based on high speed A/D converters, a fully programmable pipeline/digital filter chain and local intelligence. Questions of error correction, fault-tolerance and system redundancy are also considered. A system integration of a multichannel device in a multichip, Silicon-on-Silicon Microsystem hybrid will be used. This solution allows a new level of integration of complex analog and digital functions, with an excellent flexibility in mixing technologies for the different functional blocks. This type of VLSI multichip integration allows a high degree of programmability at both the function and the system level, and offers the possibility of customizing the microsystem with detector-specific functions.

OSTI ID:
5946291
Report Number(s):
CONF-921005-; CODEN: IETNAE
Journal Information:
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Vol. 40:4 part 1; Conference: Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference, Orlando, FL (United States), 25-31 Oct 1992; ISSN 0018-9499
Country of Publication:
United States
Language:
English