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Properties of all YBa sub 2 Cu sub 3 O sub 7 Josephson edge junctions prepared by in situ laser ablation deposition

Journal Article · · Applied Physics Letters; (USA)
DOI:https://doi.org/10.1063/1.104552· OSTI ID:5941110
; ; ;  [1]
  1. Physics Department, Technion-Israel Institute of Technology, Haifa 32 000, Israel (IL)
Thin-film YBa{sub 2}Cu{sub 3}O{sub 7}-YBa{sub 2}Cu{sub 3}O{sub 7} edge junctions of 0.4{times}10 {mu}m{sup 2} cross section were prepared {ital in} {ital situ} by a multistep laser ablation deposition process. The fabrication time was about 3 h and the yield of good devices was 50%. Typical junctions reached zero resistance at 72 K and had a critical current density {ital J}{sub {ital c}} of 300 A/cm{sup 2} at 70 K. Their {ital J}{sub {ital c}} as a function of temperature increased slowly with decreasing temperature down to 65 K and much faster below it. In the region of low {ital J}{sub {ital c}} we observed suppression of the critical current by a magnetic field. Under microwave radiation clear Shapiro steps were observed whose magnitude versus the microwave field agreed qualitatively with the resistively shunted junction model of a current biased junction.
OSTI ID:
5941110
Journal Information:
Applied Physics Letters; (USA), Journal Name: Applied Physics Letters; (USA) Vol. 58:6; ISSN APPLA; ISSN 0003-6951
Country of Publication:
United States
Language:
English