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X-ray magnetic scattering in antiferromagnetic URu sub 2 Si sub 2

Journal Article · · Physical Review Letters; (USA)
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  1. AT T Bell Laboratories, Murray Hill, NJ (USA)
  2. Oak Ridge National Laboratory, Oak Ridge, TN (USA)
  3. Department of Physics, McMaster University, Hamilton, Ontario (Canada)
  4. Atomic Energy of Canada Limited Research, Chalk River, Ontario (Canada)

X-ray-resonance magnetic scattering has been used to study antiferromagnetic ordering in the small-moment ({bar {mu}}{congruent}0.02{mu}{sub {ital B}}) heavy-fermion superconductor URu{sub 2}Si{sub 2}. The intensity of the magnetic (003) reflection develops abruptly at {ital T}{sub {ital N}}{congruent}17 K and grows linearly to {ital T}=3 K, where it saturates. Long-range antiferromagnetic order ({zeta}{sub 003}{sup {ital c}}{congruent}450 A) persists into the superconducting state at {Tc}=1.3 K demonstrating the microscopic coexistence of these two ground states. At saturation, a remarkable peak intensity of 8 counts/sec was measured.

DOE Contract Number:
AC05-84OR21400
OSTI ID:
5939604
Journal Information:
Physical Review Letters; (USA), Journal Name: Physical Review Letters; (USA) Vol. 65:26; ISSN PRLTA; ISSN 0031-9007
Country of Publication:
United States
Language:
English