In situ temperature measurement of. alpha. -mercuric iodide by reflection spectroscopy

Journal Article · Mon Dec 30 00:00:00 EST 1991 · Applied Physics Letters; (United States)

DOI:https://doi.org/10.1063/1.105629· OSTI ID:5936767

Nason, D ^[1]; Burger, A ^[2]

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1. EG G Energy Measurements, Inc., Santa Barbara Operations, Goleta, California 93117 (United States)
2. Physics Department, Fisk University, Nashville, Tennessee 37208 (United States)

Crystal face temperatures of single crystals of {alpha}-HgI{sub 2} growing in transparent ampules by physical vapor transport have been measured, {ital in} {ital situ}, by a novel, noncontact method which may be called reflectance spectroscopy thermometry. The method is based on the temperature dependence of the energy of the free-exciton peak as detected with a low-energy reflected beam. As presently configured, the accuracy is {plus minus}1.5 {degree}C for a slowly varying surface temperature. The method has potential for noncontact temperature measurement in some systems for which pyrometry is unsatisfactory.

• DOE Contract Number: AC08-83NV10282
• OSTI ID: 5936767
• Journal Information: Applied Physics Letters; (United States), Vol. 59:27; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
MERCURY IODIDES
CRYSTAL GROWTH
THERMOMETERS
DESIGN
EXCITONS
IN-SITU PROCESSING
OPTICAL REFLECTION
HALIDES
HALOGEN COMPOUNDS
IODIDES
IODINE COMPOUNDS
MEASURING INSTRUMENTS
MERCURY COMPOUNDS
MERCURY HALIDES
PROCESSING
QUASI PARTICLES
REFLECTION
440500* - Thermal Instrumentation- (1990-)
360601 - Other Materials- Preparation & Manufacture
665100 - Nuclear Techniques in Condensed Matter Physics - (1992-)