Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Fast, High-Resolution X-ray Microfluorescence Imaging

Conference · · Advances in X-Ray Analysis
 [1];  [1]
  1. Oak Ridge Y-12 Plant (Y-12), Oak Ridge, TN (United States)

X-ray micro fluorescence imaging refers to the use of an x-ray beam as a probe to excite XRF in a specimen and produce a spatially resolved image of the element distribution. The advantages of high sensitivity and low background, together with the nondestructive nature of the measurement, have lead to applications of x-ray microfluorescence analysis in biology, geology, materials science, as well as in the area of nondestructive evaluation. Previous reports have described the development of an x-ray microprobe which uses a conventional source of x-rays to produce a 10-μm beam. This paper describes improvements to the microprobe which have increased the beam power and the solid angle of detection. The data collection and display software have also been enhanced.

Research Organization:
Oak Ridge Y-12 Plant (Y-12), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC05-84OR21400
OSTI ID:
5932725
Report Number(s):
Y/DW--983; CONF-9007149--7; ON: DE91010658
Journal Information:
Advances in X-Ray Analysis, Journal Name: Advances in X-Ray Analysis Vol. 34; ISSN 0376-0308
Country of Publication:
United States
Language:
English

References (2)

Electron beam melting in microfocus X-ray tubes journal December 1986
Improved laboratory X-ray source for microfluorescence analysis journal December 1989