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Characteristics of junctions made between Pb and Si sub 2 Sr sub 2 CaCu sub 2 O sub 8+x

Conference · · IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:5930576
;  [1]
  1. Wisconsin Univ., Madison, WI (United States). Dept. of Electrical and Computer Engineering

This paper reports on investigations of the junctions made between Pb and polycrystalline Bi{sub 2}Sr{sub 2}CaCu{sub 2}O{sub 8+x} (BSCCO). The BSCCO surfaces were treated with number of methods including mechanically scraping, plasma sputtering, plasma oxidation, and Br etch before junctions were fabricated. The current-voltage characteristics and dynamic resistance (dV/dI) vs voltage have been measured at both 77K and 4.2K. We observed, among other features, a Pb gap structure similar to that seen in Pb/YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} junctions, a magnetic dependent supercurrent, an asymmetric I-V curve, and narrow resistance peaks.

OSTI ID:
5930576
Report Number(s):
CONF-900944--
Journal Information:
IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States) Vol. 27:2; ISSN IEMGA; ISSN 0018-9464
Country of Publication:
United States
Language:
English