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Determination of surface resistance and magnetic penetration depth of superconducting YBa sub 2 Cu sub 3 O sub 7 minus. delta. thin films by microwave power transmission measurements

Conference · · IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:5929671
;  [1]; ;  [2];  [3]
  1. National Aeronautics and Space Administration, Cleveland, OH (United States). Lewis Research Center
  2. Case Western Reserve Univ., Cleveland, OH (United States). Dept. of Physics
  3. Naval Research Lab., Washington, DC (United States)

This paper reports on a waveguide power transmission measurement technique developed to extract the complex conductivity {sigma} = {sigma}{sub 1} {minus} j{sigma}{sub 2} of superconducting thin films at microwave frequencies. The authors obtained the microwave conductivity of two laser-ablated YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} thin films on LaAlO{sub 3} with transition temperatures (T{sub c}) of approximately 86.3 and 82 K, respectively, in the temperature range 25 to 300 K. From the conductivity values we calculated the penetration depth {lambda} to be approximately 0.54 and 0.43 {mu}m, and the surface resistance R{sub s} to be approximately 24 and 36 n{Omega} at 36 GHz and 76 K for the two films under consideration.

OSTI ID:
5929671
Report Number(s):
CONF-900944--
Journal Information:
IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States) Vol. 27:2; ISSN IEMGA; ISSN 0018-9464
Country of Publication:
United States
Language:
English