Surface analysis of polymers: A. Applications of multitechnique analysis; B. Investigations into the application of low energy ion scattering spectrometry and static secondary ion mass spectrometry for organic analysis
The search presented herein shows how the multitechnique approach can be applied to the study of copolymers and homopolymer blends, in order to determine the surface composition of the sample. In addition, the added information gained through the combination of several techniques allows one to determine the sample morphology as well, leading to a much more complete understanding of the properties of the surface region for these polymers. Low Energy Ion Scattering Spectrometry (ISS) is introduced as a useful addition to the multitechnique analysis of polymer surfaces. The use of ISS in the multitechnique analysis of polymer surfaces demonstrates that the addition of ion beam techniques can provide information not currently available from other spectroscopic measurements. In this regard work is presented here on the Secondary Ion Mass Spectrometry (SIMS) analysis of monomer and polymer films on silver substrates. This work will explore the analytical capabilities of SIMS for the eventual use in the multitechnique study of polymers. Results are presented concerning the detection limit of SIMS for the analysis of organic films on a silver substrata and the damage rate found for different sample concentrations. In addition the work demonstrates the utility of using the negative ion mode in the SIMS analysis of organic thin films in order to obtain strong parent ion related peaks and low chemical noise. The SIMS study of these films can serve as a bridge to connect the results of SIMS investigations of organic molecules on metal substrates and the results of SIMS investigations of polymers.
- Research Organization:
- State Univ. of New York, Buffalo (USA)
- OSTI ID:
- 5927684
- Resource Relation:
- Other Information: Thesis (Ph.D)
- Country of Publication:
- United States
- Language:
- English
Similar Records
Determination of surface structure and orientation of polymerized tetrafluoroethylene films by near-edge X-ray absorption fine structure, X-ray photoelectron spectroscopy, and static secondary ion mass spectrometry
Direct surface analysis of pesticides on soil, leaves, grass, and stainless steel by static secondary ion mass spectrometry