Transient index of XeF

Conference · Sat Jan 01 04:00:00 EST 1983 · AIP Conf. Proc.; (United States)

OSTI ID:5927223

Woods, C; Tang, K; Howton, C

The phase shift due to the transient index of refraction for an e-beam excited XeF laser mix was measured. Large phase shifts have been predicted for this lasing species because of the asymmetric gain as a function of wavelength and transient absorption due to excited Ne. Previous measurement of the phase shift using a discharge-excited XeF probe indicated a transient phase shift of 5 rad for a peak gain length of about 1. These phase shifts vary with pumping leading to limits on the beam quality due to nonuniform pumping. The measurement was done using a 1 m long by 10 cm high e-beam of 350 kV and 10 A/cm/sup 2/ and 1 ..mu..s duration pumping a mixture of 3 atm Ne, 10 Torr Xe, and 2 Torr NF/sub 3/. The phase shifts were measured using a Mach-Zender interferometer and a narrow-band probe laser.

• Research Organization: Western Research Corp., San Diego, CA
• OSTI ID: 5927223
• Report Number(s): CONF-830109-
• Conference Information: Journal Name: AIP Conf. Proc.; (United States) Journal Volume: 100
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
420300* -- Engineering-- Lasers-- (-1989)
ELECTRICAL PUMPING
ELECTRON BEAM PUMPING
EXCIMER LASERS
FLUORIDES
FLUORINE COMPOUNDS
GAS LASERS
HALIDES
HALOGEN COMPOUNDS
INTERFEROMETERS
LASERS
MACH-ZEHNDER INTERFEROMETER
MEASURING INSTRUMENTS
MEASURING METHODS
PHASE SHIFT
PUMPING
RARE GAS COMPOUNDS
TRANSIENTS
WAVELENGTHS
XENON COMPOUNDS
XENON FLUORIDES