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Transient index of XeF

Conference · · AIP Conf. Proc.; (United States)
OSTI ID:5927223

The phase shift due to the transient index of refraction for an e-beam excited XeF laser mix was measured. Large phase shifts have been predicted for this lasing species because of the asymmetric gain as a function of wavelength and transient absorption due to excited Ne. Previous measurement of the phase shift using a discharge-excited XeF probe indicated a transient phase shift of 5 rad for a peak gain length of about 1. These phase shifts vary with pumping leading to limits on the beam quality due to nonuniform pumping. The measurement was done using a 1 m long by 10 cm high e-beam of 350 kV and 10 A/cm/sup 2/ and 1 ..mu..s duration pumping a mixture of 3 atm Ne, 10 Torr Xe, and 2 Torr NF/sub 3/. The phase shifts were measured using a Mach-Zender interferometer and a narrow-band probe laser.

Research Organization:
Western Research Corp., San Diego, CA
OSTI ID:
5927223
Report Number(s):
CONF-830109-
Journal Information:
AIP Conf. Proc.; (United States), Journal Name: AIP Conf. Proc.; (United States) Vol. 100; ISSN APCPC
Country of Publication:
United States
Language:
English