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Energy-loss spectra of electrons transmitted by thin aluminum films

Journal Article · · Sov. Phys. - Solid State (Engl. Transl.); (United States)
OSTI ID:5909834
The process of oxidation of Al films of thickness of 100--400 A was investigated by measuring the losses of 4.5 keV electrons transmitted by these films. Oxidation did not affect the whole aluminum film and the metal component was retained for a long time for films of thickness exceeding 150 A.
Research Organization:
Scientific-Research Institute of Nuclear Physics at the M. V. Lomonosov State University, Moscow
OSTI ID:
5909834
Journal Information:
Sov. Phys. - Solid State (Engl. Transl.); (United States), Journal Name: Sov. Phys. - Solid State (Engl. Transl.); (United States) Vol. 23:7; ISSN SPSSA
Country of Publication:
United States
Language:
English