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Multilayer mirrors as power filters in insertion device beamlines

Journal Article · · Rev. Sci. Instrum.; (United States)
DOI:https://doi.org/10.1063/1.1141083· OSTI ID:5908714
The power-filtering capabilities of multilayer bandpass x-ray mirrors relative to total reflection low-pass mirrors are presented. Results are based on calculations assuming proposed wiggler sources on the upcoming generation of low-energy (1.5 GeV) and high-energy (7.0 GeV) synchrotron radiation sources. Results show that multilayers outperform total reflection mirrors in terms of reduction in reflected power by roughly an order of magnitude, with relatively small increases in total absorbed power and power density over total reflection mirrors, and with comparable reflected flux values. Various aspects of this potential application of multilayer x-ray optics are discussed.
Research Organization:
Center for X-ray Optics, Lawrence Berkeley Laboratory, University of California, Berkeley, California 94720 (US)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
5908714
Journal Information:
Rev. Sci. Instrum.; (United States), Journal Name: Rev. Sci. Instrum.; (United States) Vol. 60:7; ISSN RSINA
Country of Publication:
United States
Language:
English