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Nb/sub 3/Al formation in sputter-deposited Nb/Al multi-layer samples

Conference ·
OSTI ID:5894130

The critical current density of powder metallurgy processed wires is determined in part by the extent of the A15 phase formation in the vicinity of the Nb/Al interface. A series of multi-layered samples was made to simulate the reactions in the P/M wires. Transmission electron microscopy was used to study the reactions between the multi-layers. Results indicate that the reactions at the Nb/Al interface depend strongly on the Nb and Al layer thickness and distribution. No evidence of the metastable NbAl solid solution formation was found. It is concluded that the Nb/sub 2/Al and the residual Nb present in the reacted P/M wires can be avoided if the Nb and Al layers are sufficiently thin and uniformly distributed with the proper stoichiometry. 10 refs., 7 figs., 2 tabs.

Research Organization:
Lawrence Berkeley Lab., CA (USA)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
5894130
Report Number(s):
LBL-22836; CONF-870272-11; ON: DE88003192
Country of Publication:
United States
Language:
English